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In-mould measurement with optical coherence tomography for compensating positioning error in injection overmoulding of optoelectronic devices


Authors: Günther Hannesschläger, Martin Schwarze, Elisabeth Leiss-Holzinger, Christian Rankl

22nd International Conference & Exhibition. 30th May - 3rd June 2022, Geneva, Switzerland

Link to publication: https://www.euspen.eu/knowledge-base/ICE22294.pdf